Pascal and Francis Bibliographic Databases

Help

Search results

Your search

kw.\*:("Testing")

Filter

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Origin

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 330350

  • Page / 13214
Export

Selection :

  • and

Effects of computer-based testing on test performance and testing motivationCHUA, Yan Piaw.Computers in human behavior. 2012, Vol 28, Num 5, pp 1580-1586, issn 0747-5632, 7 p.Article

Validity of the American College Test in predicting success on the pre-professional skills testHEARD, S. A; AYERS, J. B.Educational and psychological measurement. 1988, Vol 48, Num 1, pp 197-200, issn 0013-1644Article

A galling-resistant substitute for silicon nickelBUDINSKI, Kenneth G; BUDINSKI, Michael K; KOHLER, Mark S et al.Wear. 2003, Vol 255, Num 1, pp 489-497, issn 0043-1648, 9 p.Conference Paper

Can relevant grammatical cues result in invalid test items?PLAKE, B. S; HUNTLEY, R. M.Educational and psychological measurement. 1984, Vol 44, Num 3, pp 687-696, issn 0013-1644Article

Why does guessing incorrectly enhance, rather than impair, retention?YAN, Veronica X; YUE YU; GARCIA, Michael A et al.Memory & cognition. 2014, Vol 42, Num 8, pp 1373-1383, issn 0090-502X, 11 p.Article

Measuring the span of stress asymmetries on high-precision matched devicesTUINHOUT, H. P; BRETVELD, A; PETERS, W. C. M et al.2004 international conference on microelectronic test structures. 2004, pp 117-122, isbn 0-7803-8262-5, 1Vol, 6 p.Conference Paper

Testing times for equipmentPlastics and rubber international. 1985, Vol 10, Num 3, pp 20-28, issn 0309-4561Article

The influence of dimensionality on CAT ability estimationDE AYALA, R. J.Educational and psychological measurement. 1992, Vol 52, Num 3, pp 513-528, issn 0013-1644Article

Comparability of computerized adaptive and conventional testing with MMPI-2ROPER, B. L; BEN-PORATH, Y. S; BUTCHER, J. N et al.Journal of personality assessment. 1991, Vol 57, Num 2, pp 278-290, issn 0022-3891Article

Low-cost test rig for structural engineering tests = Plateforme expérimentale économique pour les essais de structuresALLOTEY, I. A.Matériaux et constructions. 1987, Vol 20, Num 119, pp 370-373, issn 0025-5432Article

Water retention and drainage on air side of heat exchangers—A reviewZHAOGANG QI.Renewable & sustainable energy review. 2013, Vol 28, pp 1-10, issn 1364-0321, 10 p.Article

Dr. Norm GitisPHIPPS, Karl M.Tribology & lubrication technology. 2007, Vol 63, Num 3, pp 19-23, issn 1545-858X, 5 p.Article

Can IC test learn from how a tester is testedRAJSUMAN, Rochit.Proceedings - International Test Conference. 2002, issn 1089-3539, isbn 0-7803-7542-4, p. 1186Conference Paper

Mills still have a long wish list of testing equipment needsBAILEY, J.Pulp & paper Canada. 1998, Vol 99, Num 10, pp 22-24, issn 0316-4004Article

Manufacturing issues of the 1B processorFLYNN, L. A; O'LEARY, T. M.AT&T technical journal. 1995, Vol 74, Num 3, pp 49-61, issn 8756-2324Article

Le manège de fatigue des chaussées du LCPC de NantesLe Moniteur des travaux publics et du bâtiment. 1985, Num 4, pp 70-71, issn 0026-9700Article

Test suite oscillationsNIKOLIK, Borislav.Information processing letters. 2006, Vol 98, Num 2, pp 47-55, issn 0020-0190, 9 p.Article

Common structure dimensions of the American College Testing Program Academic Test and the California Psychological InventoryMCGINLEY, H; VAN VRANKEN, R. A.Psychological reports. 1992, Vol 71, Num 2, pp 491-498, issn 0033-2941Article

On some properties of the optimally refined proportional sampling strategyFUN TING CHAN; TSONG YUEH CHEN; IENG KEI MAK et al.Computer journal (Print). 1997, Vol 40, Num 4, pp 194-199, issn 0010-4620Article

Studies of oxide-cathode/low pressure discharge lamps in a manufacturing test cellYU, W; GREGORY, G; INGRAM, P et al.Applied surface science. 1997, Vol 111, pp 311-317, issn 0169-4332Conference Paper

Utilisation d'un micro-ordinateur pour le suivi et le dépouillement d'essais de fluage = Use of a microcomputer for the follow-up and the counting of creep testsLECOCQ, M.-C.Revue pratique de contrôle industriel (1984). 1984, pp 104-108, issn 0766-5210, 4 p., 127 bisArticle

IEEE International Conference on Microelectronic Test Structures (ICMTS)MITA, Yoshio.IEEE transactions on semiconductor manufacturing. 2008, Vol 21, Num 4, pp 493-564, issn 0894-6507, 71 p.Conference Paper

Extreme academic talent: profiles of perfect scorersCOLANGELO, N; KERR, B. A.Journal of educational psychology. 1990, Vol 82, Num 3, pp 404-409, issn 0022-0663, 6 p.Article

Development of a fatigue testing system for thin filmsKIM, Chung-Youb; SONG, Ji-Ho; LEE, Do-Young et al.International journal of fatigue. 2009, Vol 31, Num 4, pp 736-742, issn 0142-1123, 7 p.Article

Effects of genotype x environment interaction on genetic gain in breeding programsMULDER, H. A; BIJMA, P.Journal of animal science. 2005, Vol 83, Num 1, pp 49-61, issn 0021-8812, 13 p.Article

  • Page / 13214